SPOT PROFILE ANALYSIS AND LIFETIME MAPPING IN ULTRAFAST ELECTRON DIFFRACTION: LATTICE EXCITATION OF SELF-ORGANIZED GE NANOSTRUCTURES ON SI(001)

Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)

Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)

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Ultrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, cnd shellac spring 2023 dome-, and relaxed clusters on Si(001) upon femtosecond laser excitation.Utilizing the difference in size and strain state the response of hut- and dome clusters can be distinguished by a transient spot profile analysis.Surface diffraction from phyre vapes {105}-type facets provide exclusive information on hut clusters.A pixel-by-pixel analysis of the dynamics of the entire diffraction pattern gives time constants of 40, 160, and 390 ps, which are assigned to the cooling time constants for hut-, dome-, and relaxed clusters.

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